ASTM E 1162 : 2011 : REDLINE
Current
Current
The latest, up-to-date edition.
Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
Available format(s)
PDF
Language(s)
English
Published date
11-01-2011
CONTAINED IN VOL. 03.06, 2015 Defines the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data reduction procedures.
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