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BS 7317-6:1990

Current

Current

The latest, up-to-date edition.

Methods for analysis of high purity copper cathode Cu-CATH-1 Method for determination of phosphorus and silicon by spectrophotometry

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-31-1990

Foreword
Committees responsible
Method
1. Scope
2. Principle
3. Reagents
4. Apparatus
5. Procedure for phosphorus
6. Procedure for silicon
7. Repeatability and reproducibility
8. Test report
Tables
1. Phosphorus calibration solutions
2. Silicon calibration solutions

Applies to low levels in high purity copper cathode specified in BS 6017.

This Part of BS 7317 describes a method for the determination of the actual amounts of the impurity elements phosphorus and silicon present in high purity copper cathode (designated Cu-CATH-1), by spectrophotometry. It is applicable to concentrations of the elements not exceeding the following limits:

phosphorus 20 µg/g (0.0020 % m/m) maximum;
silicon 25 µg/g (0.0025 % m/m) maximum.

NOTE The titles of the publications referred to in this Part of BS 7317 are listed on the inside back cover.

Committee
NFE/34
DevelopmentNote
Supersedes BS DD95-6(1987) (09/2005) Reviewed and confirmed by BSI, October 2008. (09/2008)
DocumentType
Standard
Pages
10
PublisherName
British Standards Institution
Status
Current
Supersedes

BS 7317-7:1990 Methods for analysis of high purity copper cathode Cu-CATH-1 Method for determination of lead by lanthanum hydroxide separation and atomic absorption spectrophotometry

BS 6017:1981 Specification for copper refinery shapes

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