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CEI EN IEC 60749-20:2020

Current

Current

The latest, up-to-date edition.

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

12-01-2020

Semiconductor devices - Mechanical and climatic test methods Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Committee
TC 47
DocumentType
Test Method
ISBN
978-2-8322-8727-9
Pages
0
PublisherName
Comitato Elettrotecnico Italiano
Status
Current
Supersedes

Standards Relationship
EN IEC 60749-20:2020 Identical
IEC 60749-20:2020 Identical

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