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IEC PAS 62483:2006

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Test method for measuring whisker growth on tin and tin alloy surface finishes

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

09-25-2013

Language(s)

English

Published date

09-12-2006

FOREWORD
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus
5 Sample requirements and optional preconditioning
6 Whisker inspection, length measurement and test
  conditions
Annex A - Process Flow for Sn-whisker Testing
Annex B - Validation of optical microscopy equipment
Annex C - Tin Whisker Images
Annex D - Non-Whisker Surface Formations
Annex E - Tin Whisker Test Standard Report Formats

Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document

DevelopmentNote
Stability Date: 2012. (10/2012)
DocumentType
Miscellaneous Product
Pages
27
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
DD IEC/PAS 62483:2006 Identical
NEN NPR IEC/PAS 62483 : 2006 Identical

IPC 7530 : 0 GUIDELINES FOR TEMPERATURE PROFILING FOR MASS SOLDERING PROCESSES (REFLOW AND WAVE)

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US$220.00
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