NEN-ISO 13067:2020
Current
Current
The latest, up-to-date edition.
Microbeam analysis - Electron backscatter diffraction - Measurement of average grain sIze
Available format(s)
Hardcopy
Language(s)
English
Published date
07-01-2020
Publisher
NEN-ISO 13067 describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD).
Important note : All end users must be registered with an Account prior to user licenses being assigned.Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.