16/30319120 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS
Hardcopy , PDF
English
31-01-2018
Foreword
Introduction
1 Scope
2 Normative references
3 Abbreviations
4 Terms and definitions
5 Specimen preparation for cross-sectional imaging
6 Determination of an interface position
7 Detailed Procedure for determining the
position of the Interface
8 Uncertainty of measurement result
9 Error accumulating from each step of the procedure
Annex A (informative) - Examples of processing to
the real TEM/STEM image of the three image type
Annex B (informative) - Two main applications for this method
Annex C (informative) - Calibration of scale unit:
pixel size calibration
BS ISO 20263.
| Committee |
CII/9
|
| DocumentType |
Draft
|
| Pages |
44
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| ISO 22493:2014 | Microbeam analysis — Scanning electron microscopy — Vocabulary |
| ISO 29301:2010 | Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures |
| ISO 15932:2013 | Microbeam analysis — Analytical electron microscopy — Vocabulary |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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