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BS EN 120000:1996

Current

Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-09-1996

$797.50
Including GST where applicable
Summarise this standard

Committees responsible
National foreword
Foreword
PART 1: Semiconductor optoelectronic and liquid devices
1 SCOPE
2 GENERAL
3 QUALITY ASSESSMENT PROCEDURES
4 TEST AND MEASUREMENT CONDITIONS
5 LASER MODULE RELIABILITY
PART 2: Visual inspection of LCD and rejection criteria
1 General
2 Visual inspection of viewing area
3 Seal inspection
4 Visual inspection of contact surface
5 Visual inspection for chipped material at the corners
   and edges of the glass plates
6 Visual inspection of the display
PART 3: Visual inspection requirements for opto-electronic
        semiconductor devices
1 General
2 Visual inspection requirements for dies
3 Visual inspection requirements for bonded die
4 Visual inspection requirements for packaged
   devices
PART 4: Capability approval
1 Introduction
2 Terminology
3 Procedure for granting the capability approval
4 Capability approval maintenance procedure
5 Procedure for reduction, extension or change of
   capability
6 Procedure in case of deficiency in maintenance of the
   capability approval
7 Capability manual
8 Capability test programme
9 Verification of capability (audit)
10 Quality assurance of products delivered under
   capability approval
11 Marking and ordering information
12 Capability abstract for publication purposes
13 Customer detail specifications
14 Standard catalogue items detail specifications
15 Detail specification register
16 Handling
17 Product safety
PART 5: Semiconductor laser diodes, laser diode modules
        and laser diode assemblies of assessed quality -
        Capability approval
1 General
2 Quality assessment procedures
3 Test and measurement procedures

Specifies quality assessment procedures,test methods and terminology required in the preparation of detailed specifications for optoelectronic and liquid crystal devices.

Committee
EPL/47
DevelopmentNote
Supersedes BS CECC20000(1983) which remains current. Supersedes 93/203878 DC and 91/03056 DC. (08/2005)
DocumentType
Standard
Pages
276
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
NEN EN 120000 : 1997 Identical
EN 120000 : 1996 Identical
DIN EN 120000:1996-09 Identical
I.S. EN 120000:1998 Identical

$797.50
Including GST where applicable