BS EN 60444-1:1997
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network
Hardcopy , PDF
English
15-08-2000
Committees responsible
National foreword
Foreword
1 Scope
2 Definition of resonance frequency
3 Reference plane and shielding box
4 Principle of measurement
5 Measuring circuit
5.1 The p-network
5.2 Accessories of the p-network
5.3 Associated equipment
6 Method of measurement
6.1 Initial calibration of the p-network
6.2 Frequency and resistance measurement
Appendix A - Additional information on accuracy
Annex B (normative) updating of some formulae of Appendix A
Figure 1
Figure 2
Figure 3 - Plot showing the phase change from the value at
25 O versus reference resistor values from 0 to
100 O AT 10 MHz, 50 MHz, 100 MHz and 200 MHz.
Measuring circuit according to, Figure 1 page 4
Figure 4 - Reference resistors and shorting blank
Figure 5a
Figure 5a
Figure A.1
Figure A.2
Figure A.3
Figure A.4
Figure A.5
Figure A.6
Figure A.7
Figure A.8 - A typical phase/frequency variation of an
adjusted p-network with a 25 O reference
resistor
Figure A.9 - Typical p-network
Figure A.10 - Detail of network assembly
Figure A.11 - Dimensions of contacting plates and earthed
shield; x indicates position of rod and disk
centers of p-network
Figure A.12 - Position of the reference resistor with
respect to the network contacting plates
Figure A.13 - Other design of a p-network
Defines a simple method for measuring resonance frequency and resonance resistance of quartz crystal units, and establishes a suitable measuring network.
| Committee |
W/-
|
| DevelopmentNote |
Renumbers and supersedes BS 7681-1(1993). 1997 version incorporates amendment 9657 to BS 7681-1(1993). Also numbered as IEC 60444-1. Supersedes 97/202227 DC. (04/2005)
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60444-1:1997/A1:1999 | Identical |
| DIN EN 60444-1:2000-09 | Identical |
| NBN EN 60444-1 : 1997 AMD 1 2000 | Identical |
| I.S. EN 60444-1:1999 | Identical |
| NF EN 60444-1 : 2000 | Identical |
| IEC 60444-1:1986/AMD1:1999 | Identical |
| EN 60444-1:1997 | Equivalent |
| UNE-EN 60444-1:1997 | Equivalent |
| BS EN 60444-2:1997 | Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units |
| BS EN 60444-4:1997 | Measurement of quartz crystal unit parameters Method for the measurement of the load resonance frequency <i>f</i><sub>L</sub>, load resonance resistance <i>R</i><sub>L</sub> and the calculation of other derived values of quartz crystal units, up to 30 MHz |
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