BS EN 60749-36:2003
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Hardcopy , PDF
English
19-06-2003
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 01/208601 DC (07/2003) Supersedes BS EN 60749. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
| Standards | Relationship |
| NBN EN 60749-36 : 2004 | Identical |
| EN 60749-36:2003 | Identical |
| I.S. EN 60749-36:2003 | Identical |
| NF EN 60749-36 : 2003 | Identical |
| IEC 60749-36:2003 | Identical |
| DIN EN 60749-36:2003-12 | Identical |
| UNE-EN 60749-36:2004 | Identical |
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