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BS EN 62047-26:2016

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-05-2016

$623.34
Including GST where applicable

Committee
EPL/47
DevelopmentNote
Supersedes 14/30294910 DC. (05/2016)
DocumentType
Standard
Pages
34
PublisherName
British Standards Institution
Status
Current
Supersedes

IEC 62047-26:2016 specifies descriptions of trench structure and needle structure in a micrometer scale. In addition, it provides examples of measurement for the geometry of both structures. For trench structures, this standard applies to structures with a depth of 1 µm to 100 µm; walls and trenches with respective widths of 5 µm to 150 µm; and aspect ratio of 0,006 7 to 20. For needle structures, the standard applies to structures with three or four faces with a height, horizontal width and vertical width of 2 µm or larger, and with dimensions that fit inside a cube with sides of 100 µm. This standard is applicable to the structural design of MEMS and geometrical evaluation after MEMS processes.

Standards Relationship
EN 62047-26:2016 Identical
IEC 62047-26:2016 Identical
DIN EN 62047-26:2016-12 Equivalent
I.S. EN 62047-26:2016 Equivalent
EN 60793-2-30:2009 Identical
UNE-EN 62047-26:2016 Equivalent

ISO 3274:1996 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
ISO 129-1:2004 Technical drawings — Indication of dimensions and tolerances — Part 1: General principles
EN ISO 3274:1997 Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996)
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

$623.34
Including GST where applicable