BS EN 62433-2:2017
Current
The latest, up-to-date edition.
EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
Hardcopy , PDF
English
14-11-2017
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 07/30163156 DC. (09/2010)
|
| DocumentType |
Standard
|
| Pages |
112
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
IEC62433-2:2017 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE macro-model can also be used for modelling an IC-die, a functional block and an Intellectual Property (IP) block. The ICEM-CE macro-model can be used to model both digital and analogue ICs. This edition includes the following significant technical changes with respect to the previous edition:
Incorporation of an XML based exchange format for model representation.
| Standards | Relationship |
| EN 62433-2:2017 | Identical |
| IEC 62433-2:2017 | Identical |
| I.S. EN 62433-2:2017 | Equivalent |
| UNE-EN 62433-2:2017 | Equivalent |
| IEC 61967-4:2002+AMD1:2006 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
| ISO 8879:1986 | Information processing — Text and office systems — Standard Generalized Markup Language (SGML) |
| CISPR 17:2011 | Methods of measurement of the suppression characteristics of passive EMC filtering devices |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
| EN 55017:2011 | Methods of measurement of the suppression characteristics of passive EMC filtering devices |
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