BS IEC 60747-10:1991
Current
The latest, up-to-date edition.
Semiconductor devices Generic specification for discrete devices and integrated circuits
Hardcopy , PDF
English
31-07-2011
1 Scope
2 General
3 Quality assessment procedures
4 Test and measurement procedures
Appendix A - Lot tolerance per cent defective
(LTPD) sampling plans
Appendix B - Dimensions to be checked
Appendix C - Directions for applied forces for
mechanical tests
Appendix D - (informative) - Assessment of quality
levels in ppm (parts per million)
Publication(s) referred to
General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
| Committee |
EPL/47
|
| DevelopmentNote |
Issue Date: 31/07/2011. 1991 Edition incorporates corrigendum to BS QC700000(1991). Renumbers and supersedes BS QC700000(1991). Supersedes 86/24762 DC and BS 9970-0(1985). Together with BS IEC 60748-11, it Supersedes BS 9450(1998). (08/2011)
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).
This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:
measurement methods of electrical characteristics;
climatic and mechanical tests;
endurance tests.
NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.
| Standards | Relationship |
| IEC 60747-10:1991 | Identical |
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