BS IEC 60747-5.1 : 97 AMD 13341
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - OPTOELECTRONIC DEVICES - GENERAL
23-11-2012
24-12-2001
FOREWORD
1 Scope
2 Normative references
3 Physical concepts
3.1 (Electromagnetic) radiation
3.2 Optical radiation
3.3 Visible radiation
3.4 Infrared radiation
3.5 Ultraviolet radiation
3.6 Light
3.7 Photoelectric effect
4 Types of devices
4.1 Semiconductor optoelectronic device
4.2 Semiconductor photoemitter
4.3 Semiconductor laser
4.4 Light-emitting diode (LED)
4.5 Infrared-emitting diode (IRED)
4.6 (Semiconductor) photosensitive device
4.7 (Semiconductor) photoresistor, photoconductive cell
4.8 (Semiconductor) photoresistor, photoconductive
cell
4.9 Photoelement, photovoltaic cell
4.10 Photodiode
4.11 Phototransistor
4.12 Photothyristor
4.13 Photocoupler, optocoupler
5 General terms
5.1 Optical axis
5.2 Optical port (of a semiconductor optoelectronic
device)
5.3 (optical) cladding
6 Terms related to ratings and characteristics
6.1 General
6.2 Photoemitters
6.3 Photosensitive devices
6.4 Photocouplers, optocouplers
Annex A Cross references index
Concerned with terminology relative to the semiconductor optoelectronic devices.
| Committee |
EPL/47/3
|
| DevelopmentNote |
Renumbered and superseded by BS EN 60747-5-1 (01/2002)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Identical |
| IEC 60050-731:1991 | International Electrotechnical Vocabulary (IEV) - Part 731: Optical fibre communication |
| IEC 60664-1:2007 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |