BS IEC 60747-6:2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices Discrete devices. Thyristors
Hardcopy , PDF
English
30-04-2016
07-10-2025
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS 6493-1.6(1984) (05/2001) Supersedes 94/204766 DC. (06/2005) Supersedes 13/30270189 DC. (05/2016)
|
| DocumentType |
Standard
|
| Pages |
128
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
IEC 60747-6:2016 provides standards for the following types of discrete semiconductor devices:
- reverse-blocking triode thyristors;
- reverse-conducting (triode) thyristors;
- bidirectional triodethyristors (triacs);
- turn-off thyristors.
This edition includes the following significant technical changes with respect to the previous edition:
a) Clauses 3, 4, 5, 6, and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions;
b) some parts of Clause 8 and Clause 9 were moved and added to Clause 7 of this third edition;
c) Clause 8 and 9 were deleted in this third edition;
d) Annex A was deleted.
This publication is to be read in conjunction with IEC 60747-1:2006.
| Standards | Relationship |
| IEC 60747-6:2016 | Identical |
| IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749-34:2010 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
| IEC 60050-113:2011 | International Electrotechnical Vocabulary (IEV) - Part 113: Physics for electrotechnology |
| IEC 60749-23:2004+AMD1:2011 CSV | Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life |
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