BS IEC 60748-4-3:2006
Current
The latest, up-to-date edition.
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Hardcopy , PDF
English
28-02-2007
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Characteristics
5 Measuring methods
5.1 Dynamic testing with sinusoidal signals
5.2 Dynamic tests with wideband signals
5.3 Linearity error of a linear
ADC (E[L]) (E[L(adj)]) (E[T])
5.4 Differential linearity error (E[D])
Annex A (informative) Mathematical derivations
Annex B (informative) Wideband signal generation
and analysis
Bibliography
Describes a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics
| Standards | Relationship |
| IEC 62056-31:1999 | Identical |
| IEC 60748-4-3:2006 | Identical |
| IEC 60268-10:1991 | Sound system equipment - Part 10: Peak programme level meters |
| IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
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