BS IEC 61586:1997
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Estimation of the reliability of electrical connectors
Hardcopy , PDF
English
15-08-1997
28-02-2017
FOREWORD
INTRODUCTION
1 Scope
2 General considerations
2.1 Intrinsic degradation mechanisms
2.2 Extrinsic degradation mechanisms
2.3 Control of extrinsic degradation
2.4 Failure modes and failure mechanisms
2.5 Degradation mechanisms
3 Test methods and acceleration factors
4 Reliability statistics
5 Acceptance criteria
6 Estimation of the reliability of multi-position
connectors
6.1 Estimation of connector reliability from contact
reliability when the contacts in a connector
perform statistically independently
6.2 Estimation of connector reliability using
asymptotic extreme-value distributions
7 Summary and conclusions
Annexes
A Detailed example of an extreme-value reliability
calculation
B Bibliography
Concerned with the estimating of the reliability of electrical connectors through defining and developing an appropriate accelerated testing programme. Reviews basic intrinsic degradation mechanisms of connectors to give a context for the developing of the desired test programme.
| Committee |
EPL/48
|
| DevelopmentNote |
Supersedes 93/210022 DC. (06/2005) Reviewed and confirmed by BSI, June 2007. (05/2007)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC TS 61586:1997 | Identical |
| IEC 60863:1986 | Presentation of reliability, maintainability and availability predictions |
| MIL-HDBK-217 Revision F:1991 | Reliability Prediction of Electronic Equipment |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.