BS ISO 16700:2004
Current
The latest, up-to-date edition.
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Hardcopy , PDF
English
29-09-2004
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Image magnification
5 Reference material
6 Calibration procedures
7 Accuracy of image magnification and scale marker
8 Calibration report
Annex A (informative) - Reference materials for magnification
Annex B (informative) - Parameters that influence the resultant
magnification of an SEM
Annex C (informative) - Uncertainties in magnification measurements
Annex D (informative) - Example of a test report
Bibliography
Provides a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material.
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 00/124017 DC. (10/2004) Supersedes 15/30317578 DC. (08/2016)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| ISO 16700:2016 | Identical |
| ISO 16700:2004 | Identical |
| PD 6699-1:2007 | Nanotechnologies Good practice guide for specifying manufactured nanomaterials |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO Guide 35:2017 | Reference materials — Guidance for characterization and assessment of homogeneity and stability |
| ISO Guide 30:2015 | Reference materials — Selected terms and definitions |
| ISO Guide 34:2009 | General requirements for the competence of reference material producers |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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