BS ISO 22489:2016
Current
The latest, up-to-date edition.
Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Hardcopy , PDF
English
31-10-2016
Foreword
Introduction
1 Scope
2 Normative references
3 Abbreviated terms
4 Procedure for quantification
5 Test report
Annex A (informative) - Physical effects and correction
Annex B (informative) - Outline of various correction
techniques
Annex C (informative) - Measurement of the k-ratios in
case of 'chemical effects'
Bibliography
Provides requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 05/30118737 DC (02/2007)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 22489:2016 | Identical |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 14594:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
| ISO 14595:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs) |
| ISO 17470:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry |
| ISO 22309:2011 | Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above |
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