BS ISO 29301:2017
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
Hardcopy , PDF
English
04-01-2018
26-10-2023
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Image magnification
5 Reference materials
6 Calibration procedures
7 Accuracy of image magnification
8 Uncertainty of measurement result
9 Calibration report
Annex A (informative) - Parameters that influence
the resultant magnification of a TEM
Annex B (informative) - Flowchart of image-magnification
calibration procedure
Annex C (informative) - How to decide the number
of lines for averaging
Annex D (informative) - Reference materials for
magnification calibration
Annex E (informative) - Example of test report for
calibration of TEM magnification
Bibliography
Defines a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM).
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 09/30179503 DC. (06/2010) Supersedes 17/30346182 DC. (01/2018)
|
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).
| Standards | Relationship |
| ISO 29301:2017 | Identical |
| ISO 29301:2010 | Identical |
| ISO 16700:2016 | Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO 17034:2016 | General requirements for the competence of reference material producers |
| ISO Guide 35:2017 | Reference materials — Guidance for characterization and assessment of homogeneity and stability |
| ISO Guide 30:2015 | Reference materials — Selected terms and definitions |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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