CEI EN 60749-28 : 1ED 2017

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Required equipment
5 Periodic tester qualification, waveform records, and waveform
  verification requirements
6 CDM ESD testing requirements and procedures
7 CDM classification criteria
Annex A (normative) - Verification module (metal disc)
specifications and cleaning guidelines for verification
modules and testers
Annex B (normative) - Capacitance measurement of verification
        modules (metal discs) sitting on a tester field plate
        dielectric
Annex C (informative) - CDM test hardware and metrology
        improvements
Annex D (informative) - CDM tester electrical schematic
Annex E (informative) - Sample oscilloscope setup and waveform
Annex F (informative) - Field-induced CDM tester discharge
        procedures
Annex G (informative) - Waveform verification procedures
Annex H (informative) - Determining the appropriate charge delay
        for full charging of a large module or device
Annex I (informative) - Electrostatic discharge (ESD) sensitivity
        testing direct contact charged device model (DC-CDM)
Bibliography

Sets up the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).