CEI EN 60749-4:2017-10
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Published date
01-10-2017
Publisher
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The standard in question completely replaces the CEI EN 60749-4:2004-03 standard, which remains applicable until 07-04-2020.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-4:2017 | Identical |
| EN 60749-4:2017 | Identical |
Summarise
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