Name: CEI EN 60749-4:2017-10 - Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Brand: Comitato Elettrotecnico Italiano

Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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Hardcopy , PDF

Language(s)

English

Published date

01-10-2017

Publisher

Comitato Elettrotecnico Italiano

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The standard in question completely replaces the CEI EN 60749-4:2004-03 standard, which remains applicable until 07-04-2020.

Committee	CT 309
DocumentType	Test Method
ISBN	978-2-8322-4002-1
Pages	18
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN 60749-4 : 2004

Standards	Relationship
IEC 60749-4:2017	Identical
EN 60749-4:2017	Identical

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CEI EN 60749-4:2017-10

Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Abstract

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