CEI EN 60749-42 : 2016
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 42: TEMPERATURE AND HUMIDITY STORAGE
Hardcopy , PDF
English
01-01-2016
FOREWORD
1 Scope
2 Normative references
3 Test equipment
4 Procedure
5 Failure criteria
6 Information to be given in applicable procurement document
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Specifies a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-128. (06/2016)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-42:2014 | Identical |
| IEC 60749-42:2014 | Identical |
| IEC 60749-20:2008 | Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat |
| EN 60749-20:2009 | Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat |
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