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CEI EN 61967-4 : 2009

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2009

Superseded date

15-07-2025

$121.10
Including GST where applicable
Summarise this standard

FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
Annex A (normative) - Probe calibration procedure
Annex B (informative) - Classification of conducted
        emission levels
Annex C (informative) - Example of reference levels
        for automotive applications
Annex D (informative) - EMC requirements and how
        to use EMC IC measurement techniques
Annex E (informative) - Example of a test set-up
        consisting of an EMC main test board and
        EME IC test board
Annex F (informative) - 150 ohm direct coupling networks
        for common mode emission measurements of
        differential mode data transfer ICs and similar
        circuits
Annex ZA (normative) - Normative references to
         international publications with their corresponding
         European publications

Defines a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-1024. (08/2015)
DocumentType
Standard
Pages
44
ProductNote
New child EC 2017 is now added
PublisherName
Comitato Elettrotecnico Italiano
Status
Superseded
SupersededBy

Standards Relationship
EN 61967-4 : 2002 COR 2017 Identical

⚠

A newer version of this standard is available.

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$121.10
Including GST where applicable