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CEI EN IEC 60749-17 : 2019

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods Part 17: Neutron irradiation

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-10-2019

La presente Norma sostituisce completamente la Norma CEI EN 60749-17:2004-11 che rimane applicabile fino al 02-05-2022.

Committee
CT 309
DocumentType
Errata
ISBN
978-2-8322-6702-8
Pages
0
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 60749-17:2019 Identical
EN IEC 60749-17:2019 Identical