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DIN EN 60747-15:2012-08

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-08-2012

Superseded date

01-08-2025

$224.79
Including GST where applicable

1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols
  4.1 General
  4.2 Additional subscripts/symbols
  4.3 List letter symbols
5 Essential ratings (limiting values) and characteristics
  5.1 General
  5.2 Ratings (limiting values)
  5.3 Characteristics
6 Verification of ratings (limiting values)
  6.1 Isolation voltage between terminals and base plate
      (V[isol])
  6.2 Peak case non-rupture current
  6.3 Maximum terminal current (I[tRMS])
  6.4 Surge (non-repetitive) current test (I[FSM]; I[TSM])
7 Methods of measurement of characteristics
  7.1 Rated partial discharge inception and extinction
      voltages (V[i]) (V[e])
  7.2 Parasitic stray inductance between main terminals (L[P])
  7.3 Parasitic stray capacitance of functional circuit
      elements to case (C[P])
  7.4 Measuring methods for thermal characteristics
  7.5 Measuring methods of mechanical characteristics
8 Acceptance and reliability
  8.1 General requirements
  8.2 List of endurance tests
  8.3 Type tests and routine tests of isolated power devices
Annex A (informative) Test method for peak case non-rupture
        current
        A.1 Purpose
        A.2 Circuit diagram
        A.3 Circuit description and requirements
        A.4 Test procedure
        A.5 Post-test measurements and criteria
        A.6 Specified conditions
        A.7 Reference documents
Annex B (informative) Measuring method of the thickness of
        thermal compound paste
        B.1 Background information to 7.4.2
        B.2 Measuring method
Annex C (informative) Climatic parameters and characteristics
        C.1 Background information to 5.3.8
Annex D (informative) Internal circuit configurations
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications
Bibliography

DevelopmentNote
Supersedes DIN IEC 60747-15. (08/2012)
DocumentType
Standard
Pages
28
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
IEC 60747-15:2010 Identical
BS EN 60747-15:2012 Identical
EN 60747-15:2012 Identical
I.S. EN 60747-15:2012 Identical
NF EN 60747-15 : 2013 Identical
NBN EN 60747-15 : 2012 Identical
UNE-EN 60747-15:2012 Equivalent

$224.79
Including GST where applicable