DIN EN 62047-16:2015-12
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 16: TEST METHODS FOR DETERMINING RESIDUAL STRESSES OF MEMS FILMS - WAFER CURVATURE AND CANTILEVER BEAM DEFLECTION METHODS (IEC 62047-16:2015)
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
01-01-2015
$170.78
Including GST where applicable
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62047-16:2015 | Identical |
| EN 62047-16:2015 | Identical |
| I.S. EN 62047-16:2015 | Equivalent |
| BS EN 62047-16:2015 | Equivalent |
| UNE-EN 62047-16:2015 | Equivalent |
Summarise
$170.78
Including GST where applicable
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