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DIN IEC 62416:2007-08 (Draft)

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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HOT CARRIER TEST ON MOS TRANSISTORS

Published date

12-01-2013

Superseded date

01-12-2010

Superseded by

DIN EN 62416:2010-12

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Dieses Dokument legt das Hot-Carrier-Prüfverfahren für NMOS- und PMOS-Transistoren auf Waferniveau fest. Die Prüfung wurde erarbeitet, um zu ermitteln, inwiefern die einzelnen Transistoren eines bestimmten (C)MOS-Prozesses der geforderten Hot-Carrier-Lebensdauer entsprechen.

DocumentType
Draft
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Superseded
SupersededBy

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