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DSCC 13206C:2023

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, DIGITAL-LINEAR, VOLTAGE SUPERVISOR, MONOLITHIC SILICON

Published date

10-05-2023

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current
Supersedes

ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

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