DSCC 87554J:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, CMOS, 1-OF-8 DECODER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Published date
29-01-2025
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device classes B, Q and M) and space application (device classes S and V).
| DocumentType |
Revision
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| JEDEC JESD 78:1997 | IC LATCH-UP TEST |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-HDBK-103 Revision AW:2016 | List of Standard Microcircuit Drawings |
| JEDEC JESD 20:1990 | STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES: |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision L:2018 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
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