EN 61788-7:2006

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
  5.1 Measurement system
  5.2 Measurement apparatus for R[s]
  5.3 Dielectric rods
6 Measurement procedure
  6.1 Specimen preparation
  6.2 Set-up
  6.3 Measurement of reference level
  6.4 Measurement of the frequency response of resonators
  6.5 Determination of surface resistance of the
      superconductor and epsilon['] and tan delta of the
      standard sapphire rods
7 Precision and accuracy of the test method
  7.1 Surface resistance
  7.2 Temperature
  7.3 Specimen and holder support structure
  7.4 Specimen protection
8 Test report
  8.1 Identification of test specimen
  8.2 Report of R[s] values
  8.3 Report of test conditions
Annex A (informative) Additional information relating to
         Clauses 1 to 8
Annex ZA (normative) Normative references to international
         publications with their with their corresponding
         European publications
Bibliography

This part of IEC 61788 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of surface resistances for this method is as follows: - Frequency: 8 GHz < f < 30 GHz - Measurement resolution: 0,01 milliohm at 10 GHz.