I.S. EN 61967-6:2003
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
Hardcopy , PDF
English
01-01-2003
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
Annex A (normative) Probe calibration procedure -
Microstrip line method
Annex B (informative) Measurement principle and
calibration factor
Annex C (informative) Spatial resolution of magnetic
probe
Annex D (informative) Angle pattern of probe placement
Annex E (informative) Advanced magnetic probe
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Bibliography
Gives a method for evaluating RF currents on the pins of an integrated circuit (IC) by means on non-contact current measurement using a miniature magnetic probe.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
72
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 61967-6 : 2002 | Identical |
| DIN EN 61967-6:2008-10 | Identical |
| NF EN 61967-6 : 2003 AMD 1 2008 | Identical |
| IEC 61967-6:2002+AMD1:2008 CSV | Identical |
| NBN EN 61967-6 : 2002 AMD 1 2008 | Identical |
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