IEC 60147-2:1963
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
01-01-1963
31-12-2021
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
| DocumentType |
Standard
|
| Pages |
55
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NFC 96 112 : 81 AMD 1 81 | Similar to |
| NEN 10147-2 : 1986 | Identical |
| NFC 96 113 : 1980 | Similar to |
| NEN EN 100012 : 1995 | Identical |
This standard has been withdrawn and is no longer current. No replacement edition is available.
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