IEC 60147-2J:1978
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Supplement J - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -Part 2: General principles of measuring methods - Chapter 7: Analogue integrated circuits
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English - French, Russian
01-01-1978
23-07-2013
IEC 60747-1:2006+AMD1:2010 CSV
IEC 60747-2:2016
IEC 60747-6:2016
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
115
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN EN 100012 : 1995 | Identical |
| NEN 10147-2 : 1986 | Identical |
| DIN 44480-44 : 1983 | Similar to |
| DIN 44480-47 : 1983 | Similar to |
| DIN 44480-48 : 1983 | Similar to |
| DIN 44480-31 : 1980 | Similar to |
| DIN 44480-39 : 1982 | Similar to |
| DIN 44480-49 : 1983 | Similar to |
| DIN 44480-1 : 1980 | Similar to |
| DIN 44480-25 : 1980 | Similar to |
| DIN 44480-26 : 1980 | Similar to |
| DIN 44480-38:1982-03 | Similar to |
| DIN 44480-30 : 1980 | Similar to |
| DIN 44480-46 : 1983 | Similar to |
| DIN 44480-63:1983-05 | Similar to |
| DIN 44480-33 : 1980 | Similar to |
| DIN 44480-45:1982-03 | Similar to |
| DIN 44480-29 : 1980 | Similar to |
| DIN 44480-34 : 1981 | Similar to |
| DIN 44480-27 : 1980 | Similar to |
| DIN 44480-28 : 1980 | Similar to |
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