IEC 60261:1989
Current
The latest, up-to-date edition.
Sealing test for pressurized waveguide tubing and assemblies
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
30-01-1989
FOREWORD
PREFACE
Clause
1. Scope
2. Units
3. Test method A: Pressure drop during elapsed
time (quantity test)
3.1 Definitions of terms and symbols
3.2 Test procedure
3.3 Preferred test conditions
3.4 Summary of details which may need to be
specified in the relevant specification
4. Test method B: Leak rate
4.1 Definition, units of terms and symbols
4.2 Test apparatus
4.3 Test procedure
4.4 Summary of details which may need to be
specified in the relevant specification
4.5 Preferred test conditions
5. Test method C: Bubble test (quality test)
5.1 Test procedure
5.2 Preferred test conditions
5.3 Summary of details which may need to be
specified in the relevant specification
6. Test method D: Halogen leakage test (quality test)
7. Test method E: Helium leakage test (quantity and
quality test)
FIGURE
Specifies uniform measuring methods for sealing tests for pressurized waveguide components and assemblies. These measuring methods are carried out with regard to quantity and quality.
| DevelopmentNote |
Stability Date: 2021. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NFC 93 51990 : 1990 | Similar to |
| CEI 46-16 : 1998 | Identical |
| PN HD 138 : 2010 | Identical |
| BIS IS 9817 : 1992(R2003) | Identical |
| HD 138 : 200S2 | Identical |
| NFC 93 591 : 1990 | Similar to |
| DIN IEC 60261:1991-05 | Identical |
| UNE 20261:1993 | Identical |
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