IEC 60749-1:2002/COR1:2003
Current
Current
The latest, up-to-date edition.
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Amendment of
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French
Published date
12-08-2003
Publisher
Free
Including GST where applicable
Summarise this standard
AI-generated summary
Modification of the validity date: now put at 2007.
| Committee |
TC 47
|
| DocumentType |
Corrigendum
|
| Pages |
1
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60335-2-11:2001 | Identical |
Free
Including GST where applicable
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