IEC 60749-18:2002
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
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English - French
13-12-2002
25-11-2021
Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
| Committee |
TC 47
|
| DevelopmentNote |
Stability Date: 2020. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NF EN 60749-18 : 2003 | Identical |
| NEN EN IEC 60749-18 : 2003 | Identical |
| I.S. EN 60749-18:2003 | Identical |
| PN EN 60749-18 : 2005 | Identical |
| BS EN 60749-18:2003 | Identical |
| CEI EN 60749-18 : 2004 | Identical |
| EN 60749-18:2003 | Identical |
| DIN EN 60749-18:2003-09 | Identical |
| UNE-EN 60749-18:2003 | Identical |
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