IEC 61124:2012

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations
   and symbols
4 General requirements and area of application
5 General test procedure
6 Sequential test plans
7 Fixed time/failure terminated test
   plans - Fixed duration test plans
8 Design of alternative time/failure terminated
   test plans
9 Calendar time/failure terminated test plans for
   non-replaced items
10 Combined test plans
11 Performing the test
12 Presentation of results
Annex A (normative) - Tables and graphs for sequential
        test plans
Annex B (normative) - Graphs for fixed time/failure
        terminated test plans
Annex C (normative) - Graphs for alternative time/failure
        terminated test plans
Annex D (normative) - Tables and graphs for combined
        test plans and additional sequential test plans
Annex E (informative) - Examples and mathematical
        references for sequential test plans
Annex F (informative) - Design of sequential test plans
        using a common spreadsheet program
Annex G (informative) - Examples and mathematical
        references for fixed time/failure terminated test
        plans - Fixed duration test plans
Annex H (informative) - Design of fixed duration
        time/failure terminated test plans using
        a spreadsheet program
Annex I (informative) - Examples and mathematical
        references for the design of alternative
        time/failure terminated test plans
Annex J (informative) - Examples and mathematical
        references for the calendar time terminated
        test plans
Annex K (informative) - Derivation and mathematical
        reference for the optimized test plans of
        GOST R 27 402
Bibliography

IEC 61124:2012 gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of: failure rate, failure intensity, meantime to failure (MTTF), and mean operating time between failures (MTBF). The main changes with respect to the previous edition are as follows:
- A number of new test plans have been added based on the Russian standard GOST R 27.402 [1], and it is intended to align the new edition of MIL-HDBK-781 [2] with this edition. Algorithms for optimizing test plans using a spreadsheet program are given and a number of optimized test plans are listed. Furthermore, emphasis is laid on the fact that the test should be repeated following design changes;
- Discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7 [3], now withdrawn, have been corrected so these test plans differ from those given in previous editions of IEC 61124. As requested by the National Committees, mathematical background material and spreadsheet program information has been moved to informative annexes. In addition, the symbol lists have been divided, so that some annexes have separate lists of symbols;
- Guidance on how to choose test plans has been added as well as guidance on how to use spreadsheet programs to create them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected;
- Subcluses 8.1, 8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged, except for updated terminology and references. The contents of the corrigendum of January 2013 have been included in this copy.