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IEC 61164:2004

Current

Current

The latest, up-to-date edition.

Reliability growth - Statistical test and estimation methods

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

24-03-2004

$714.89
Including GST where applicable
Summarise this standard

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.

Committee
TC 56
DevelopmentNote
A Bilingual edition has been published. (03/2012) Stability Date: 2018. (09/2017)
DocumentType
Standard
Pages
55
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
NF EN 61164 : 2004 Identical
NEN EN IEC 61164 : 2004 Identical
I.S. EN 61164:2004 Identical
PN EN 61164 : 2007 Identical
AS IEC 61164-2008 Identical
BS EN 61164:2004 Identical
CEI EN 61164 : 2006 Identical
EN 61164:2004 Identical
DIN EN 61164:2004-11 Identical
UNE-EN 61164:2005 Identical
BS 5760-17:1995 Identical
CEI 56-37 : 1ED 2000 Identical
BS EN 60311:2003+A2:2009 Identical

$714.89
Including GST where applicable