IEC 61164:2004
Current
The latest, up-to-date edition.
Reliability growth - Statistical test and estimation methods
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
24-03-2004
IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.
This publication is to be read in conjunction with IEC 61014:2003.
| Committee |
TC 56
|
| DevelopmentNote |
A Bilingual edition has been published. (03/2012) Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
55
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 61164 : 2004 | Identical |
| NEN EN IEC 61164 : 2004 | Identical |
| I.S. EN 61164:2004 | Identical |
| PN EN 61164 : 2007 | Identical |
| AS IEC 61164-2008 | Identical |
| BS EN 61164:2004 | Identical |
| CEI EN 61164 : 2006 | Identical |
| EN 61164:2004 | Identical |
| DIN EN 61164:2004-11 | Identical |
| UNE-EN 61164:2005 | Identical |
| BS 5760-17:1995 | Identical |
| CEI 56-37 : 1ED 2000 | Identical |
| BS EN 60311:2003+A2:2009 | Identical |