EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

05-10-2010

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope
2 Integrated circuit and modelling board
3 Assumptions
4 Modelling
5 Parameter extractions
6 Implementation
Annex A (informative) - Nodal equation
Annex B (informative) - Example of black box modelling
Bibliography

IEC/TR 62433-2-1:2010 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors. This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.

Committee	TC 47/SC 47A
DevelopmentNote	Stability Date: 2013. (10/2012)
DocumentType	Technical Report
Pages	0
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NEN NPR IEC/TR 62433-2-1 : 2010	Identical
PD IEC/TR 62433-2-1:2010	Identical

IEC 62014-1:2001	Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2)
IEC TS 62404:2007	Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
IEC TS 62433-1:2011	EMC IC modelling - Part 1: General modelling framework

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IEC TR 62433-2-1:2010

EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory