IEEE 1450-2023
Current
The latest, up-to-date edition.
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Hardcopy , PDF
English
24-04-2024
This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for applic...
| Committee |
Test Technology
|
| DocumentType |
Standard
|
| ISBN |
979-8-8557-0629-1
|
| Pages |
147
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| Supersedes |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.