IEEE DRAFT 1546 : D3.0 2000

1. OVERVIEW
     1.1 SCOPE
     1.2 PURPOSE
2. REFERENCES
3. DEFINITION OF TERMS AND ACRONYMS
     3.1 KEY TERMS
     3.2 ACRONYMS
4. DTIF FUNCTIONAL GROUPS
     4.1 UUT MODEL GROUP
           4.1.1 PI_NAMES(4)
           4.1.2 PO_NAMES(5)
           4.1.3 MAIN_MODEL(6)
           4.1.4 COMPONENT_TYPE(7)
           4.1.5 USER_NODE(8)
           4.1.6 INPUT_PIN_NAMES(9)
           4.1.7 OUTPUT_PIN_NAMES(10)
           4.1.8 NEAR_FROMS_POINTERS(11)
           4.1.9 NEAR_FROMS(12)
           4.1.10 NODE_SOURCE(16)
           4.1.11 TRISTATE_FROMS_POINTERS(21)
           4.1.12 TRISTATE_FROMS(22)
           4.1.13 PSEUDOPI_NAMES(23)
           4.1.14 AUXILIARY_PIN_NAMES(27)
           4.1.15 NODE_NAMES(35)
     4.2 STIMULUS AND RESPONSE GROUP
           4.2.1 STIMULUS(2)
           4.2.2 PO_RESPONSE(3)
           4.2.3 TIMING_SETS(24)
           4.2.4 TIMING_PER_PATTERN(25)
           4.2.5 PHASE_CONNECTIONS(26)
           4.2.6 PI_FORMATS(28)
           4.2.7 FORMAT_ATTRIBUTES(29)
           4.2.8 BURSTS(33)
           4.2.9 STIMULUS_ TEXT(34)
     4.3 FAULT DICTIONARY GROUP
           4.3.1 F.D._POPATS(18)
           4.3.2 F.D._FAULT_SIGNATURES(19)
           4.3.3 F.D._PRINT_STRINGS(20)
           4.3.4 F.D._CROSS_ REFERENCE(30)
           4.3.5 EQUIV_FAULTS(37)
           4.3.6 F.D._EQUIV_FAULTS(39)
     4.4 PROBE GROUP
           4.4.1 EVENT(13)
           4.4.2 SETTLED_STATE_ONLY(14)
           4.4.3 SETTLED_STATE_&_PULSES(15)
           4.4.4 STEPS(17)
           4.4.5 PROBETAG_DEFINITIONS(31)
           4.4.6 PROBETAG_ASSIGNMENTS(32)
           4.4.7 EVENTS_INIT(36)
           4.4.8 PROBE_DETECTION(38)
5. DTIF APPLICATION EXAMPLE
     5.1 APPLICATION EXAMPLE-UUT MODEL GROUP
     5.2 APPLICATION EXAMPLE-STIMULUS AND RESPONSE
           GROUP
     5.3 APPLICATION EXAMPLE-FAULT DICTIONARY GROUP
     5.4 APPLICATION EXAMPLE-PROBE GROUP