ISO 11877:2008
Current
The latest, up-to-date edition.
Hardmetals — Determination of silicon in cobalt metal powders — Photometric method
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19-05-2008
ISO 11877:2008 specifies a photometric method to be used for the determination of the mass fraction of silicon in the range of 20 µg/g to 300 µg/g in cobalt metal powders.
| DevelopmentNote |
Supersedes ISO/DIS 11877. (05/2008)
|
| DocumentType |
Standard
|
| Pages |
4
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| NEN ISO 11877 : 2008 | Identical |
| SS-ISO 11877:2010 | Identical |
| BS ISO 11877:2008 | Identical |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO 5725-3:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 3: Intermediate measures of the precision of a standard measurement method |
| ISO 5725-6:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 6: Use in practice of accuracy values |
| ISO 5725-4:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 4: Basic methods for the determination of the trueness of a standard measurement method |
| ISO 5725-2:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method |
| ISO 5725-5:1998 | Accuracy (trueness and precision) of measurement methods and results — Part 5: Alternative methods for the determination of the precision of a standard measurement method |
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