JEDEC JEP163A:2022
Current
The latest, up-to-date edition.
Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
Hardcopy , PDF
English
01-12-2022
This publication isintended as a guideline to develop and establish conditionsfor burn-in and life test of MILThis publication isintended as a guideline to develop and establish conditionsfor burn-in and life test of MIL PRF-38535 QML integrated circuits.
| DocumentType |
Standard
|
| Pages |
28
|
| ProductNote |
This standard also refers to JEDEC JEP122, JEDEC JESD 85
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
| DSCC 21221A:2025 | MICROCIRCUIT, LINEAR, RADIATION HARDNESS ASSURED, SYNCHRONOUS BUCK CONVERTER, MONOLITHIC SILICON |
| DSCC 17237A:2023 | MICROCIRCUIT, BiCMOS, RADIATION HARDENED, ULTRA LOW NOISE, DUAL LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.