JEDEC JESD 22-C101E : 2013
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
22-11-2018
Publisher
Superseded date
10-03-2020
Superseded by
Including GST where applicable
All packaged semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard.
| Committee |
JC-14.1
|
| DocumentType |
Revision
|
| Pages |
0
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC V62/23634:2025 | MICROCIRCUIT, LINEAR, USER PROGRAMMABLE POWER MANAGEMENT IC (PMIC) WITH THREE STEPDOWN DC/DC CONVERTERS AND FOUR LOW DROPOUT (LDO) REGULATORS, MONOLITHIC SILICON |
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