JEDEC JESD 57A:2017
Current
The latest, up-to-date edition.
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION:
Hardcopy , PDF
English
01-11-2017
This test method defines the requirements and procedures for single-event effects (SEE) testing of analog and/or digital discrete semiconductor devices and integrated circuits by irradiation with energetic heavy ions.
| DocumentType |
Test Method
|
| Pages |
56
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
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| DSCC V62/24635A:2026 | Microcircuit, Digital, 12 Bit Asynchronous Binary Counter, Monolithic Silicon |
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