JEDEC JESD17:1988
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
LATCH-UP IN CMOS INTEGRATED CIRCUITS
Hardcopy , PDF
English
01-08-1988
13-06-2018
To define a standard measurement procedure for the characterization of CMOS integrated circuit latch-up susceptibility/immunity, measured under static conditions.
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy |
| DSCC 92317K:2026 | MICROCIRCUIT, DIGITAL, Bi-CMOS, OCTALPI-BUS TRANSCEIVER, MONOLITHIC SILICON |
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