JEDEC JESD47L:2022
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Stress-Test-Driven Qualification of Integrated Circuits
Hardcopy , PDF
English
01-12-2022
25-08-2025
This standard describes a baseline set of acceptance tests for use in qualifying electronic devices as new products, a product family, or as products in a process which is being changed.
| DocumentType |
Revision
|
| Pages |
36
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| JEDEC JESD93A:2022 | MULTICHIP MODULES (MCM) |
| JEDEC JEP155B:2018(R2024) | Recommended ESD Target Level for HBM Qualification |
| JEDEC JESD22-A111C:2025 | Evaluation Procedure for Determining Capability to Bottom Side Board Attach by Full Body Solder Immersion of Small Surface Mount Solid State Devices |
| CEI EN IEC 62506:2024 | Methods for product accelerated testing |
| JEDEC JESD218B.03:2024 | Solid-State Drive (SSD) Requirements and Endurance Test Method |
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