JEDEC JESD47N:2026
Current
The latest, up-to-date edition.
Stress-Test-Driven Qualification of Integrated Circuits
Hardcopy , PDF
English
01-08-2026
This standard describes a baseline set of acceptance tests for use in qualifying electronic devices as new
products, a product family, or as products in a process which is being changed.
| DocumentType |
Standard
|
| Pages |
42
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
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