Name: JIS H 0613:1978 - Visual inspection for sliced and lapped silicon wafers
Brand: Japanese Standards Association

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Visual inspection for sliced and lapped silicon wafers

Published date

05-01-1978

Publisher

Japanese Standards Association

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DocumentType	Standard
PublisherName	Japanese Standards Association
Status	Current

78(R1999) [20/06/1999]78 [01/01/1978]

JIS C 7612:1985

Illuminance measurements for lighting installations

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JIS H 0613:1978