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NASA MSFC PROC 1832 : 1990

Current

Current

The latest, up-to-date edition.

THE SAMPLING AND ANALYSIS OF NONVOLATILE RESIDUE CONTENT ON CRITICAL SURFACES

Published date

01-01-1990

1. PURPOSE
2. SCOPE
3. DEFINITION
4. APPLICABLE DOCUMENTS
5. ABBREVIATIONS
6. SUPPLY REQUIREMENTS
7. GENERAL REQUIREMENTS
8. EQUIPMENT PREPARATION
9. SAMPLING SWAB METHOD
10. SAMPLING FLUSH METHOD
11. ANALYSIS

Establishes a standard method for sampling and analysis of nonvolatile residue content on critical surfaces.

DocumentType
Standard
PublisherName
National Aeronautics and Space Administration
Status
Current

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